NVME_DEVICE_SELF_TEST_LOG structure (nvme.h)

Contains fields that specify the information in a Device Self Test log page that describes the status, completion percentage, and results of a device self-test.

This structure is returned by the Get Log Page command. For more information, see NVME_CDW10_GET_LOG_PAGE.

Syntax

typedef struct {
  struct {
    UCHAR Status : 4;
    UCHAR Reserved : 4;
  } CurrentOperation;
  struct {
    UCHAR CompletePercent : 7;
    UCHAR Reserved : 1;
  } CurrentCompletion;
  UCHAR                             Reserved[2];
  NVME_DEVICE_SELF_TEST_RESULT_DATA ResultData[20];
} NVME_DEVICE_SELF_TEST_LOG, *PNVME_DEVICE_SELF_TEST_LOG;

Members

CurrentOperation

A CurrentOperation structure containing fields that describe the current Device Self-Test operation.

CurrentOperation.Status

Indicates the status of the current Device Self-Test operation.

CurrentOperation.Reserved

A reserved field in the CurrentOperation structure.

CurrentCompletion

A CurrentCompletion structure containing fields that describe the completion of a Device Self-Test operation.

CurrentCompletion.CompletePercent

Indicates the percentage of completion of the Device Self-Test operation. This field is valid if the CurrentOperation.Status field is non-zero.

CurrentCompletion.Reserved

A reserved field in the CurrentCompletion structure.

Reserved[2]

A reserved field.

ResultData[20]

An array of 20 NVME_DEVICE_SELF_TEST_RESULT_DATA structures that contain result data for the last 20 Device Self-Test operations, sorted in order from the most recent to the oldest available.

Requirements